标题: NI TestStand处理用于航空电子的老化测试模型 [打印本页] 作者: admin 时间: 2014-10-12 12:59 标题: NI TestStand处理用于航空电子的老化测试模型 Author(s):
Nick Martin BSc Hons. MIEE. - Serco Systems Engineering Business Group
Robin Lord BEng Hons. - Serco Systems Engineering Business Group
Author Information:
For more information on this Case Study, contact:
Robin Lord BEng Hons.
Serco Systems Engineering Business Group
Wellington Gate, Silverthorne Way
Waterllooville PO7 7XY
United Kingdom
Tel: +44(0)2392 784950
[email=ian.tongea href=]ian.tonge@serco.com[/email]