A Signal Collecting System of Multi-frequency Laser Wavemeter based on ADμC842 MCU
摘要:介绍一种基于ADμC842单片机的激光波长计信号采集系统,该系统采用ADμC842外部触发DMA工作方式,实现对待测信号的大容量快速采集和存储,具有采集精度高、速度快、性价比高、可靠性好、易于控制程序开发等优点。使采集数据FFT变换成为可能,以便在频谱图上得到多波长激光频谱。
关键词:波长计;单片机;DMA;锁相环
This paper introduces a signal collecting system of infrared wavemeter based on ADμC842 MCU. In this system, ADμC842 works in the mode of external trigger enable DMA to collect signal in big capability. It has merits of high precision and fast speed in collection, high ratio of performance to price, good reliability, simplicity in the development of control procedure and so on.. This enables system to take the signal data FFT conversion and get spectrum of multi-frequency optic in the graph of frequent domain.
Keywords:Wavemeter;MCU;DMA;PLL
1引言
激光波长/频率测量仪器即波长计(wave-meter),可用来测量调谐激光器的输出波长值,或者用于测量未知激光的波长值,在光频标研究领域有着重要的作用。激光波长计基于迈克尔逊干涉原理:两束激光相互叠加,产生干涉条纹,比对已知波长的参考激光和未知波长的被测激光的干涉条纹数目,可以获得被测激光的波长/频率值。
2基于迈克尔逊干涉仪的波长计原理
迈克尔逊波长计适合测量连续激光波长,其光学系统采用迈克尔逊干涉原理,如图1所示。
参考光源输出光束1,经多次反射,分为两束同频率的光,最后汇聚于B点发生干涉,由光探测器D1接收,作为参考信号。
待测光由光栏射入,与射出的参考光调整至重合;两个反射器R1和R2安装在同一可动的平行导轨上。在波长计工作时,驱动电机拖动导轨沿轴向连续往返平动,使参考光和待测光产生光程差,发生干涉现象,由光探测器D1和D2接收,由此得到它们的干涉条纹的信号。